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[WEBSITE__22052_558cf835] T-I Max HCl

T-I Max HCl

Detection and continuous monitoring of Hydrogen Chloride (HCl) Airborne Molecular Contaminants (AMCs) in Semiconductor Cleanrooms
[WEBSITE__22073_c0d25b77] T-I Max HF

T-I Max HF

Detection & continuous monitoring of HF & Airborne Molecular Contaminants (AMCs) in Semiconductor Cleanrooms
[WEBSITE__22072_6db4f810] T-I Max CEM

T-I Max CEM

Measures for NH₃, HCl, HF, H₂S, CO, CH₄, and more for compliance and process control
[WEBSITE__22051_24f774a4] HALO LP H2O

HALO LP H2O

Low parts per billion (ppb) moisture detection capability in NH₃ and PH₃
[WEBSITE__22043_8d9f49f6] HALO 3 N2O

HALO 3 N2O

Trace level nitrous oxide analysis - sub-parts-per-million (ppm) N2O detection capability
[WEBSITE__21854_f1c3757f] CO-rekt

CO-rekt

Parts-per-billion CO analysis for Air Separation Units, Nitrogen Plants, High-Purity Gases & Systems and Syngas & Fuel Gas Production
[WEBSITE__21919_c3742bfd] HALO OK/OK+

HALO OK/OK+

Monitors oxygen impurity levels with part-per-trillion accuracy, drift-free stability and instantaneous response
[WEBSITE__21920_3de57b0b] HALO QRP

HALO QRP

Moisture detection at partial pressure of 1 µTorr and below
[WEBSITE__21921_c2f95ea8] HALO RP H2O

HALO RP H2O

Trace level moisture analysis at reduced pressure conditions in inert, acid and hydride gases

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